The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Feb. 04, 2013
Applicant:

Toyo Seikan Group Holdings, Ltd., Shinagawa-ku, Tokyo, JP;

Inventors:

Takuro Ito, Yokohama, JP;

Satomi Ozawa, Yokohama, JP;

Satoru Kito, Yokohama, JP;

Kazuhiko Yamazaki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65D 23/08 (2006.01); B65D 1/02 (2006.01); C23C 16/27 (2006.01); C08J 7/12 (2006.01); B65D 23/02 (2006.01); C23C 16/26 (2006.01); C23C 16/511 (2006.01); B05D 7/04 (2006.01); B05D 7/00 (2006.01); B05D 1/00 (2006.01); B65D 65/46 (2006.01);
U.S. Cl.
CPC ...
B65D 23/0807 (2013.01); B65D 1/0215 (2013.01); B65D 23/02 (2013.01); C08J 7/123 (2013.01); C23C 16/26 (2013.01); C23C 16/27 (2013.01); C23C 16/511 (2013.01); B05D 1/62 (2013.01); B05D 7/04 (2013.01); B05D 7/50 (2013.01); B05D 2490/50 (2013.01); B65D 65/466 (2013.01); C08J 2367/04 (2013.01); Y02W 90/12 (2015.05); Y10T 428/1379 (2015.01); Y10T 428/24975 (2015.01); Y10T 428/31786 (2015.04);
Abstract

A polylactic acid formed body including a polylactic acid base material () and a hydrocarbon film () vapor-deposited on the surface of the base material by a plasma CVD method. The polylactic acid base material () exhibits a sharp X-ray diffraction peak in which a half-width of peak appearing in the 10°-25° wide angle X-ray measurement is not more than 1.22°, and the hydrocarbon film () is vapor-deposited on the surface of the polylactic acid base material (), and includes two layers of a high CHlayer () having a ratio of CHper the total of CH, CHand CHof not less than 40% and a low CHlayer () formed on the high CHlayer () and having a ratio of CHper the total of CH, CHand CHof not more than 35%.


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