The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Apr. 01, 2015
Semiconductor Components Industries, Llc, Phoenix, AZ (US);
Yan Ping Lim, Corvallis, OR (US);
Dennis Engelbrecht, Corvallis, OR (US);
Raymond Allen Davis, Salem, OR (US);
Agustin Hernandez, Albany, OR (US);
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Phoenix, AZ (US);
Abstract
An imaging system with real-time digital testing capabilities verifies the functionality of image processing circuitry used to process pixel data signals read out from a pixel array during imaging operations. Image processing circuitry may process a data frame read from an imaging array that includes multiple regions of imaging and non-imaging data. Digital test patterns may be generated to test the functionality of specific image processing blocks. Test patterns may correspond to or represent imaging data or non-imaging data from regions of the output readout frame. A checksum generator generates a test pattern checksum for output of a subset of the image processing blocks that were provided with a given test pattern. The test pattern checksum may be compared to a predetermined checksum of the output of properly functioning image processing blocks provided with test patterns equivalent to the given test pattern.