The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

May. 14, 2013
Applicant:

Flir Systems, Inc., Wilsonville, OR (US);

Inventors:

Stanley H. Garrow, Lompoc, CA (US);

Nicholas Högasten, Santa Barbara, CA (US);

Theodore R. Hoelter, Goleta, CA (US);

Katrin Strandemar, Rimbo, SE;

Pierre Boulanger, Goleta, CA (US);

Barbara Sharp, Santa Barbara, CA (US);

Eric A. Kurth, Santa Barbara, CA (US);

Malin Ingerhed, Linköping, SE;

Assignee:

FLIR Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 5/365 (2011.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H04N 5/3658 (2013.01);
Abstract

Various techniques are provided to capture one or more thermal image frames using an infrared sensor array that is fixably positioned to substantially de-align rows and columns of infrared sensors. In one example, an infrared imaging system includes an infrared sensor array comprising a plurality of infrared sensors arranged in rows and columns and adapted to capture a thermal image frame of a scene exhibiting at least one substantially horizontal or substantially vertical feature. The infrared imaging system also includes a housing. The infrared sensor array is fixably positioned within the housing to substantially de-align the rows and columns from the feature while the thermal image frame is captured.


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