The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Aug. 01, 2016
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Young-Su Cho, Daejeon, KR;

Joo-Young Kim, Daejeon, KR;

Ju-Il Jeon, Daejeon, KR;

Myung-In Ji, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04L 29/08 (2006.01); H04L 12/26 (2006.01); H04W 4/02 (2009.01);
U.S. Cl.
CPC ...
H04L 67/22 (2013.01); H04L 43/0876 (2013.01); H04L 67/16 (2013.01); H04W 4/02 (2013.01);
Abstract

A user participation-based measurement information utilization system and a user participation-based measurement information utilization server and method. The user participation-based measurement information utilization server includes a measurement information collection unit for collecting user measurement information corresponding to at least one of sensor information and wireless communication heterogeneous infrastructure measurement information from a terminal of a user, on which a measurement information utilization application is installed, a pattern update unit for updating a user pattern corresponding to the user in a measurement information correlation database (DB) in accordance with the user measurement information based on a time at which the user measurement information is collected, and a service provision unit for providing measurement information utilization service to the user based on one or more similar patterns having a correlation with the user pattern among multiple patterns included in a measurement information list.


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