The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Oct. 09, 2012
Applicants:
Uwe Baeder, Ottobrunn, DE;
Holger Jauch, Munich, DE;
Ingo Gruber, Munich, DE;
Inventors:
Assignee:
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/14 (2013.01); H04L 41/0803 (2013.01); H04L 43/50 (2013.01);
Abstract
The measuring system comprises a measuring device and a device under test (). This measuring device comprises a high-frequency processing unit (), which is embodied to receive high-frequency signals from the device under test () and/or to transmit high-frequency signals to the device under test () via a first connection (). The measuring system further comprises a test-software server unit (), which is embodied to supply test-software to the device under test ().