The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Sep. 12, 2014
Applicant:

Elwha Llc, Bellevue, WA (US);

Inventors:

Jeffrey A. Bowers, Bellevue, WA (US);

David Jones Brady, Durham, NC (US);

Tom Driscoll, San Diego, CA (US);

John Desmond Hunt, Knoxville, TN (US);

Roderick A. Hyde, Redmond, WA (US);

Nathan Ingle Landy, Mercer Island, WA (US);

Guy Shlomo Lipworth, Durham, NC (US);

Alexander Mrozack, Durham, NC (US);

David R. Smith, Durham, NC (US);

Clarence T. Tegreene, Mercer Island, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 19/10 (2006.01); G01S 13/88 (2006.01); H01Q 3/24 (2006.01); H01Q 19/00 (2006.01); H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 19/10 (2013.01); G01S 13/887 (2013.01); H01Q 3/24 (2013.01);
Abstract

An array of scattering and/or reflector antennas are configured to produce a series of beam patterns, where in some embodiments the scattering antenna and/or the reflector antenna includes complementary metamaterial elements. In some embodiments circuitry may be configured to set a series of conditions corresponding to the array to produce the series of beam patterns, and to produce an image of an object that is illuminated by the series of beam patterns.


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