The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Apr. 09, 2014
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, JP;

Inventors:

Yosuke Nakanishi, Tokyo, JP;

Hiroaki Okabe, Tokyo, JP;

Motoru Yoshida, Tokyo, JP;

Kazuyuki Sugahara, Tokyo, JP;

Takaaki Tominaga, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/16 (2006.01); H01L 29/47 (2006.01); H01L 21/268 (2006.01); H01L 21/28 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); H01L 29/872 (2006.01); H01L 21/04 (2006.01);
U.S. Cl.
CPC ...
H01L 21/268 (2013.01); H01L 21/02529 (2013.01); H01L 21/0485 (2013.01); H01L 29/475 (2013.01); H01L 29/66143 (2013.01); H01L 29/872 (2013.01); H01L 29/1608 (2013.01);
Abstract

A method of manufacturing a silicon carbide semiconductor device is provided. The method suppresses the increase in the number of manufacturing steps and is capable of suppressing the degradation of ohmic characteristics of an alloy layer with respect to a semiconductor substrate. The method includes a step of forming a metal layer made of a first metal on a semiconductor substrate made of silicon carbide; a step of forming a metal nitride film obtained by nitriding a second metal on the metal layer; a step of directing a laser light through the metal nitride film to form a layer of an alloy of silicon carbide in the semiconductor substrate and the first metal in the metal layer; and a step of forming an electrode on the metal nitride film.


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