The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Jul. 31, 2014
Applicant:
Bombardier Inc., Dorval, CA;
Inventors:
Patrick Cadotte, Dollard-des-Ormeaux, CA;
Sean Lahey, Baie d'Urfe, CA;
Assignee:
BOMBARDIER INC., Dorval, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); G01L 19/00 (2006.01); G01L 19/08 (2006.01); G01P 13/02 (2006.01); G01D 5/02 (2006.01); B64C 13/50 (2006.01); G01N 25/72 (2006.01); G01N 19/08 (2006.01); G01P 5/16 (2006.01); G01P 21/02 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); B64C 13/503 (2013.01); G01D 5/02 (2013.01); G01L 19/0092 (2013.01); G01L 19/086 (2013.01); G01N 19/08 (2013.01); G01N 25/72 (2013.01); G01P 5/16 (2013.01); G01P 13/025 (2013.01); G01P 21/025 (2013.01); G07C 5/0816 (2013.01);
Abstract
An aircraft air data probe contamination monitor includes at least two air data sensor probes, a first probe located on one side of the aircraft, a second probe located on an opposite side of the aircraft, each probe being operable to generate a parameter value from an airflow passing the in-flight aircraft. The monitor also includes a processor operable to compare the generated parameter value from the first probe to the generated parameter value from the second probe to determine if one of the first probe and the second probe is contaminated.