The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Jun. 18, 2015
Vmware, Inc., Palo Alto, CA (US);
Uday Kurkure, Los Altos Hills, CA (US);
Hari Sivaraman, Livermore, CA (US);
Peter Farkas, Santa Cruz, CA (US);
Xingze He, San Jose, CA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
Techniques disclosed herein provide an approach using pixel perturbation to measure image quality. In one embodiment, a pixel perturbation engine perturbs pixels in an image with a reference image for measuring quality of the image after transmission. By perturbing least significant bits, a composite image may be generated in which the reference image is hidden in the original image. The perturbations in the composite image may then be recovered after the composite image is transmitted to a remote device and used to determine image quality based on preservation of the perturbations. In another embodiment, image(s) perturbed with reference image(s) at increasingly higher order bit positions may be transmitted, and quality of the transmitted reference image determined, until the determined quality exceeds a threshold, with the perturbed bit position at which the determined quality exceeds the threshold being indicative of the quality of the image(s) transmitted.