The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Nov. 29, 2015
Seedonk, Inc., Fremont, CA (US);
Fred Cheng, Los Altos Hills, CA (US);
Herman Yau, Sunnyvale, CA (US);
Tend Insights, Inc., Fremont, CA (US);
Abstract
A method and an image analysis system including an orientation correction processor (OCP), a spatial sensor, and an analytics unit for detecting a target object from an image and validating the detection of the target object are provided. The OCP receives and processes image data from a series of image frames captured by an image sensor and spatial data from the spatial sensor. The OCP generates orientation data using the image data, the spatial data, timestamp data, and lens data of the image sensor. The OCP generates resultant image data by associating the generated orientation data with the received and processed image data simultaneously for each image frame. The analytics unit, in communication with the OCP, processes and analyzes the generated resultant image data with reference to an analytic dataset library to detect the target object from the image and validate the detection of the target object.