The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Feb. 08, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Jeffrey Allan Kolthammer, Cleveland Heights, OH (US);

Raymond Frank Muzic, Jr., Mentor, OH (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06F 19/00 (2011.01); A61B 6/00 (2006.01); G06T 7/00 (2017.01); G06F 17/50 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06F 19/3437 (2013.01); A61B 6/037 (2013.01); A61B 6/503 (2013.01); A61B 6/507 (2013.01); A61B 6/5217 (2013.01); G06F 17/5009 (2013.01); G06T 7/0016 (2013.01); A61B 6/032 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10084 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/30104 (2013.01);
Abstract

A method for estimating parameter values includes acquiring image data with an imaging apparatus, deriving a parameter model function from the image data, generating a N-dimensional grid, wherein N is a number of values of one or more non-linear terms of the derived model function, pre-calculating the one or more non-linear terms given the parameter model function and the designated values of the non-linear parameters, calculating one or more remaining model terms of the parameter model function, and displaying at least one of the one or more non-linear terms and remaining linear model terms.


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