The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9841509 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 12, 2017

Filed:

Nov. 24, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jie Jerry Liu, Niskayuna, NY (US);

Kwang Hyup An, Rexford, NY (US);

Gautam Parthasarathy, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); H01L 51/00 (2006.01); H01L 51/44 (2006.01); H01L 27/30 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2018 (2013.01); H01L 27/308 (2013.01); H01L 51/0002 (2013.01); H01L 51/0026 (2013.01); H01L 51/441 (2013.01);
Abstract

A process for fabricating an organic x-ray detector is presented. The process includes forming a multilayered structure that includes disposing a first electrode layer on a thin film transistor array, disposing an organic absorber layer on the first electrode layer, and disposing a second electrode layer on the organic absorber layer. The process further includes disposing a scintillator layer on the second electrode layer and thermally treating the multilayered structure after the step of disposing the second electrode layer. An organic x-ray detector fabricated by the process is further presented. An x-ray system including the organic x-ray detector is also presented.


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