The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Mar. 18, 2016
Siemens Aktiengesellschaft, Munich, DE;
Alto Stemmer, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
To enable improved adjustment of at least one shim channel for magnetic resonance imaging of an examination region of an examination object by operation of a magnetic resonance apparatus that has a shim arrangement with a first shim channel volume having at least one first shim channel and a second shim channel volume having at least one second shim channel, the examination region is divided into multiple of sections, multiple first shim parameter sets are determined for the at least one first shim channel, with one first shim parameter set among the multiple first shim parameter sets being ascertained for each of the multiple sections, a second shim parameter set is ascertained for the at least one second shim channel, taking into account the ascertained multiple first shim parameter sets, and magnetic resonance image data of the examination region are acquired, but before this acquisition, the at least one second shim channel is adjusted using the second shim parameter set and the at least one first shim channel is adjusted for acquiring the magnetic resonance image data from a specific section of the multiple sections using a first shim parameter set ascertained for that specific section.