The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Jan. 15, 2016
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Jung Hwan Hwang, Daejeon, KR;

Jong Hwa Kwon, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/04 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0206 (2013.01); G01R 33/0005 (2013.01);
Abstract

Provided is a magnetic field measuring device including a first sensor unit which includes a first coil sensor configured to output a first sensor signal, a second sensor unit which includes a second coil sensor configured to output a second sensor signal and disposed in a direction perpendicular to the first coil sensor, a third sensor unit which includes a third coil sensor configured to output a third sensor signal and disposed in a direction perpendicular to the first and second coil sensors, and a digital signal processor outputs magnetic flux density based on a voltage difference between the first and fourth nodes, wherein the first to third sensor units respectively output first to third output signals in which specific voltages of the first to third sensor signals are maintained for a predetermined period of time.


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