The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Aug. 15, 2013
Applicant:

Kyushu Institute of Technology, Fukuoka, JP;

Inventors:

Shinya Ohtsuka, Fukuoka, JP;

Toshitake Umegane, Fukuoka, JP;

Hiroki Shibata, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2006.01); G01R 13/00 (2006.01); H01H 33/26 (2006.01); H01H 33/53 (2006.01);
U.S. Cl.
CPC ...
G01R 13/00 (2013.01); G01R 31/1272 (2013.01); H01H 33/26 (2013.01); H01H 33/53 (2013.01);
Abstract

An electromagnetic wave identification device includes a detection section for detecting an electromagnetic wave signal which is output from an antenna for detecting electromagnetic waves and whose level is equal to or greater than a predetermined level; a measurement and record section for recording and storing the detected electromagnetic wave waveform data; and an analysis and evaluation section for receiving the recorded and stored electromagnetic wave waveform data, normalizing the electromagnetic wave waveform data by an maximum amplitude value to obtain normalized data, and determining whether or not the received electromagnetic wave is a direct wave by reference to the normalized data. The analysis and evaluation section determines whether or not the received electromagnetic wave is a direct wave by obtaining a kurtosis from a histogram of amplitude values of the normalized data and determining whether or not the kurtosis is equal to or greater than a predetermined threshold, or by obtaining a normal probability plot from the normalized data and determining whether a value of the normalized data at a predetermined probability is equal to or greater than, or equal to or less than, a predetermined threshold.


Find Patent Forward Citations

Loading…