The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Feb. 05, 2014
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Hidenao Iwai, Hamamatsu, JP;
Takuji Kataoka, Hamamatsu, JP;
Satoshi Yamamoto, Hamamatsu, JP;
Norikazu Sugiyama, Hamamatsu, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Kentaro Goto, Hamamatsu, JP;
HAMAMASTU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An aggregated cell evaluation apparatus includes a laser light source, a speckle image acquisition unit, an SC calculation unit, an evaluation unit, and a memory unit. The speckle image acquisition unit acquires a two-dimensional speckle image by forward scattered light generated in aggregated cells by irradiation of the aggregated cells with laser light output from the laser light source. The SC calculation unit calculates a speckle contrast value Kof a speckle image Iat each time t, determines a maximum value Kamong the speckle contrast values Kto K, and normalizes the speckle contrast value Kat each time tby the maximum value Kto obtain a normalized speckle contrast value K'. The evaluation unit evaluates motion of the aggregated cells, based on the normalized speckle contrast value K′ at each time t.