The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Mar. 19, 2012
Applicant:

Michael Frank, Loveland, CO (US);

Inventor:

Michael Frank, Loveland, CO (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09F 19/00 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8651 (2013.01);
Abstract

A device for processing measurement data assigned to a measurement on a fluidic sample to be separated, the measurement data having multiple features being indicative of different fractions of the fluidic sample, the device includes a feature position analysis unit configured for analyzing positions (p, p, d, d) of at least a part of the features relative to one another, and a display adjustment unit configured for adjusting, based on a result of the analyzing, a mode of displaying at least a part of the features along at least one display axis of a display diagram so that at least a part of adjacent features is positioned equidistantly along the at least one display axis or so that at least a part of adjacent features is positioned to have a distance (d) from one another which is larger than or equal to a predefined threshold value (d).


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