The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Oct. 16, 2014
Applicant:
3m Innovative Properties Company, St. Paul, MN (US);
Inventors:
Evan J. Ribnick, St. Louis Park, MN (US);
John A. Ramthun, Hudson, WI (US);
David D. Miller, North St. Paul, MN (US);
Assignee:
3M INNOVATIVE PROPERTIES COMPANY, St. Paul, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/898 (2006.01); G01N 21/84 (2006.01); G01N 21/89 (2006.01); G01N 21/88 (2006.01); G06T 3/40 (2006.01); G06T 5/20 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/44 (2017.01);
U.S. Cl.
CPC ...
G01N 21/8983 (2013.01); G01N 21/8422 (2013.01); G01N 21/8851 (2013.01); G01N 21/8915 (2013.01); G06T 3/40 (2013.01); G06T 5/20 (2013.01); G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06T 7/44 (2017.01); G01N 2021/8427 (2013.01); G01N 2021/8917 (2013.01); G01N 2201/12 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30124 (2013.01);
Abstract
A method for characterizing the uniformity of a material includes selecting a set of size scales at which to measure uniformity within an area of interest in an image of the material; suppressing features in the image smaller than a selected size scale of interest within the set of size scales; dividing the image into patches equal to the size scale of interest; and calculating a uniformity value within each patch.