The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Jun. 24, 2015
Applicants:

Robert Furstenberg, Largo, MD (US);

Chris Kendziora, Burke, VA (US);

R. Andrew Mcgill, Lorton, VA (US);

Viet K. Nguyen, Gaithersburg, MD (US);

Inventors:

Robert Furstenberg, Largo, MD (US);

Chris Kendziora, Burke, VA (US);

R. Andrew McGill, Lorton, VA (US);

Viet K. Nguyen, Gaithersburg, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 5/60 (2006.01); G02B 21/00 (2006.01); G01N 21/17 (2006.01); G01J 3/443 (2006.01); G01J 3/45 (2006.01); G01N 21/3563 (2014.01); G01N 21/41 (2006.01); G01N 21/45 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/02 (2013.01); G01J 3/0202 (2013.01); G01J 3/443 (2013.01); G01J 3/45 (2013.01); G01J 5/60 (2013.01); G01N 21/171 (2013.01); G02B 21/008 (2013.01); G02B 21/0028 (2013.01); G01J 2003/2826 (2013.01); G01N 21/3563 (2013.01); G01N 21/41 (2013.01); G01N 21/45 (2013.01); G01N 2021/1714 (2013.01); G01N 2021/1725 (2013.01); G01N 2021/1731 (2013.01); G01N 2021/393 (2013.01);
Abstract

A non-destructive method for chemical imaging with ˜1 nm to 10 μm spatial resolution (depending on the type of heat source) without sample preparation and in a non-contact manner. In one embodiment, a sample undergoes photo-thermal heating using an IR laser and the resulting increase in thermal emissions is measured with either an IR detector or a laser probe having a visible laser reflected from the sample. In another embodiment, the infrared laser is replaced with a focused electron or ion source while the thermal emission is collected in the same manner as with the infrared heating. The achievable spatial resolution of this embodiment is in the 1-50 nm range.


Find Patent Forward Citations

Loading…