The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Jun. 02, 2015
Kemeny Associates Llc, Midldeton, WI (US);
Gabor John Kemeny, Verona, WI (US);
Gard Anders Groth, Madison, WI (US);
Christopher Erwin Zueger, Chicago, IL (US);
Xu Zhai, Madison, WI (US);
Gina Elaine Stuessy, Middleton, WI (US);
Natalie Ann Crothers, Wisconsin Dells, WI (US);
Howland Jones, Rio Rancho, NM (US);
Kemeny Associates LLC, Middleton, WI (US);
Abstract
A spectrometric device for optical analysis of material composition, coating thickness, surface porosity, and/or other characteristics uses several monochromatic light sources—e.g., laser diodes—to illuminate a sample, with a camera taking an image of the sample under each source's light, and with the various images then being combined to generate a (hyper)spectral image. To address the difficulty in obtaining uniform illumination intensity across the illuminated sample area with solid-state light sources, the output from the light sources may be supplied to an integrating sphere (preferably after being combined within a fiber combiner), and then to a fiber bundle whose output ends are configured as a ring light (a ring of fiber ends directing light at a common spot). The camera may then focus on the spot, at which the sample may be placed for illumination and imaging.