The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Sep. 30, 2015
Corning Incorporated, Corning, NY (US);
Douglas Clippinger Allan, Corning, NY (US);
CORNING INCORPORATED, Corning, NY (US);
Abstract
Methods are provided for measuring the asymmetry of glass-sheet manufacturing processes. The methods include subjecting glass sheets or test samples taken from glass sheets to an ion-exchange process and measuring warp values. Metrics for the asymmetry of the glass-sheet manufacturing process are then obtained from the warp values. In one embodiment, the metric is independent of the geometry of the glass sheets or the test samples (the BMmetric); in another embodiment, the metric is independent of the geometry of the glass sheets or the test samples and substantially independent of the ion-exchange process used in the testing (the ASYM metric).