The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Sep. 18, 2009
Yosef Koronyo, Los Angeles, CA (US);
Maya Koronyo, Los Angeles, CA (US);
Keith L. Black, Los Angeles, CA (US);
Michal Schwartz, Rehovot, IL;
Daniel L. Farkas, Los Angeles, CA (US);
Yosef Koronyo, Los Angeles, CA (US);
Maya Koronyo, Los Angeles, CA (US);
Keith L. Black, Los Angeles, CA (US);
Michal Schwartz, Rehovot, IL;
Daniel L. Farkas, Los Angeles, CA (US);
YEDA RESEARCH AND DEVELOPMENT CO., LTD., Rehovot, IL;
CEDARS-SINAI MEDICAL CENTER, Los Angeles, CA (US);
Abstract
The present subject matter relates to a non-invasive optical imaging method for monitoring early pathological events specific to Alzheimer's disease (AD), such as the development, amount and location of amyloid plaques. The ability to monitor such events provides a basis for, among other things, AD diagnosis, prognosis and assessment of potential therapies. In addition, the present subject matter introduces novel methods for treating AD and retinal ailments associated with AD. Aβ-plaque detection in living brains is extremely limited, especially at high resolution; therefore the present invention is based on studies focusing on the eyes as an alternative to brain-derived tissue that can be imaged directly, repetitively and non-invasively.