The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Nov. 21, 2014
Applicant:
Samsung Medison Co., Ltd., Hongcheon-gun, KR;
Inventors:
Kwang-hee Lee, Hongcheon-gun, KR;
Jae-moon Jo, Seongnam-si, KR;
Assignee:
SAMSUNG MEDISON CO., LTD., Hongcheon-gun, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); G06T 7/11 (2017.01); G06T 7/143 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
A61B 8/44 (2013.01); G06K 9/6277 (2013.01); G06T 7/11 (2017.01); G06T 7/143 (2017.01); G06T 2207/10132 (2013.01); G06T 2207/30021 (2013.01);
Abstract
Provided is an image processing apparatus for fitting a model to image data. The image processing apparatus determines a final parameter set and a final inlier scale of a first model by iteratively performing a model estimation process and an inlier scale estimation process, wherein the model estimation process determines a model parameter set, and the inlier scale estimation process determines an inlier scale by using the determined model parameter set.