The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Jun. 27, 2014
Koninklijke Philips N.v., Eindhoven, NL;
Ewald Roessl, Henstedt-Ulzburg, DE;
Gerhard Martens, Henstedt-Ulzburg, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating () for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments () comprising a filter material () and a second plurality of opening segments (). The filter segments and the opening segments are arranged alternating as a filter pattern (). The filter material is made from a material with structural elements () comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating () and an analyzer grating () of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator () comprising a plurality of bars () and slits (). The filter pattern is aligned with the pre-collimator pattern ().