The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Oct. 24, 2013
Mesuro Limited, Pencoed, Bridgend South Wales, GB;
Tudor Vyvyan Williams, Rhondda Cynon Taff, GB;
Paul Juan Tasker, Aberthin, GB;
Other;
Abstract
A method of calibrating a high frequency signal measurement system is described. The measurement system is in the form of a network analyzer () and has first and second phase-locked signal sources (SS& SS) and at least two measurement receivers (). A phase meter () is provided. A reference signal (F) is outputted at a first frequency from the first signal source (SS). The second signal source (SS) steps through a multiplicity of different test frequencies (nF), being phase-locked with the reference signal (F), which are applied in turn to a part of the measurement system. Measurements are taken, via the two measurement receivers (), of characteristics of the resulting signal at a measurement plane. The absolute phase of the signal at the measurement plane is also measured with the phase meter (). Calibration data is generated which relates the characteristics of the signals as measured by the measurement system () and the absolute phase as measured with the phase meter ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile