The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Jul. 12, 2006
Applicants:

Rodger F. Schuttert, Eindhoven, NL;

Geertjan Joordens, Sunnyvale, CA (US);

Willem F. Slendebroek, Lent, NL;

Inventors:

Rodger F. Schuttert, Eindhoven, NL;

Geertjan Joordens, Sunnyvale, CA (US);

Willem F. Slendebroek, Lent, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/20 (2006.01); G01R 31/317 (2006.01); G01R 31/3193 (2006.01); H04L 1/24 (2006.01);
U.S. Cl.
CPC ...
H04L 1/205 (2013.01); G01R 31/31725 (2013.01); G01R 31/31937 (2013.01); H04L 1/242 (2013.01);
Abstract

A method of testing a data transmission and reception system comprises sending a test signal from a transmitter () of the system to a receiver () of the system, and analyzing the received signal. A duty cycle relationship is varied between the test signal and the timing signal used by the receiver of the system, and the effect of the duty cycle variation is analyzed. Varying the duty cycle relationship provides duty cycle distortion (DCD), and this can be considered as a form of embedded jitter insertion. This type of jitter can be measured relatively easily.


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