The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Jun. 16, 2015
Applicant:

Peregrine Semiconductor Corporation, San Diego, CA (US);

Inventors:

Mark Moffat, Mortimer, GB;

Andrew Christie, Mawsley, GB;

Duncan Pilgrim, Encinitas, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01); H01L 21/66 (2006.01); H01L 23/15 (2006.01); H01L 23/31 (2006.01); H01L 23/66 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 22/14 (2013.01); H01L 22/32 (2013.01); H01L 24/97 (2013.01); H01L 23/15 (2013.01); H01L 23/3121 (2013.01); H01L 23/66 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/48 (2013.01); H01L 2223/6627 (2013.01); H01L 2224/131 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/16235 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/94 (2013.01); H01L 2224/97 (2013.01); H01L 2924/10253 (2013.01); H01L 2924/14 (2013.01); H01L 2924/1421 (2013.01); H01L 2924/15159 (2013.01); H01L 2924/15162 (2013.01); H01L 2924/15192 (2013.01); H01L 2924/15787 (2013.01); H01L 2924/16251 (2013.01);
Abstract

An extension of conventional IC fabrication processes to include some of the concepts of flip-chip assemblies while producing a final 'non-flip chip' circuit structure suitable for conventional packaging or for direct usage by customers. Multiple IC dies are fabricated on a semiconductor wafer in a conventional fashion, solder bumped, and singulated. The singulated dies are then flip-chip assembled onto a single tile substrate of thin-film material which has been patterned with vias, peripheral connection pads, and one or more ground planes. Once dies are flip-chip mounted to the thin-film tile, all of the dies on the entire tile may be probed using automated testing equipment. Once test probing is complete, the dies and tile are singulated into die/tile assemblies.


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