The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Jun. 26, 2014
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Klaus Erhard, Hamburg, DE;

Hanno Heyke Homann, Hannover, DE;

Jonas Rikard Rehn, Sollentuna, SE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/08 (2011.01); G06T 15/20 (2011.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
G06T 15/08 (2013.01); A61B 6/025 (2013.01); A61B 6/502 (2013.01); G06T 15/205 (2013.01); G06T 2210/41 (2013.01);
Abstract

A method and related apparatus (VS) for synthetic projection images, in particular synthetic 2D mammograms (S) formed from a 3D image volume T made up of slices (SL). It is proposed to compute a forward projection (FP) using a weighted average function that is implemented by a filter (FL). The filter function (FL) is configured such that that voxels in a slice with maximum sharpness are assigned highest weights thereby avoiding blurring by averaging with structurally less relevant slices.


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