The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Sep. 07, 2012
David Morgan-mar, Wollstonecraft, AU;
Tuan Quang Pham, Epping, AU;
Matthew R Arnison, Umina Beach, AU;
Kieran Gerard Larkin, Putney, AU;
David Morgan-Mar, Wollstonecraft, AU;
Tuan Quang Pham, Epping, AU;
Matthew R Arnison, Umina Beach, AU;
Kieran Gerard Larkin, Putney, AU;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A technique determines a depth measurement associated with a scene captured by an image capture device. The technique receives at least first and second images of the scene, in which the first image is captured using at least one different camera parameter than that of the second image. At least first and second image patches are selected from the first and second images, respectively, the selected patches corresponding to a common part of the scene. The selected image patches are used to determine which of the selected image patches provides a more focused representation of the common part. At least one value is calculated based on a combination of data in the first and second image patches, the combination being dependent on the more focused image patch. The depth measurement of the common part of the scene is determined from the at least one calculated value.