The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Nov. 18, 2016
Applicant:

Ebay Inc., San Jose, CA (US);

Inventor:

Nate L Lyman, Livermore, CA (US);

Assignee:

eBay Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06K 15/00 (2006.01); G06Q 30/00 (2012.01); G06F 19/00 (2011.01); G06Q 30/06 (2012.01); G06Q 30/02 (2012.01); H04W 4/02 (2009.01); G06K 7/14 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G06Q 30/0631 (2013.01); G06K 7/1417 (2013.01); G06K 19/06037 (2013.01); G06Q 30/0282 (2013.01); G06Q 30/0629 (2013.01); G06Q 30/0639 (2013.01); H04W 4/023 (2013.01);
Abstract

A method and a system are disclosed for generating a recommendation of a retail location on a network-based system. For example, a system may obtain a retail location definition associated with a geographic location. The geographic location may represent the retail location. The system then builds a scan event model from product scan messages received from a plurality of scanning devices located within the geographic location. The scan event model may include one or more scan events each being associated with a product definition and the retail location definition. Next, a recommendation query from the search device is received by the system. The recommendation query may include a product identifier and a query location. The system may generate a recommendation of the retail location based on determining that the product identifier and the query location match the one or more scan events of the scan event model.


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