The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Feb. 17, 2013
International Business Machines Corporation, Armonk, NY (US);
Ronen Levy, Haifa, IL;
Tamer Salman, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for generating test by data utilizing analytics. The method, the method comprising: receiving a characteristic of a first data set, the first data set representative of data to be used by a computer program application; receiving a second data set, the second data set representative of additional data to be used by the computer program application; performing data analytics on the second data set for extracting a set of properties of the second data set; determining a similarity degree between the set of properties and the characteristic of the first data set; and responsive to the similarity degree being below a threshold, generating test data based on the set of properties.