The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Nov. 16, 2011
Wolfgang Becken, Munich, DE;
Gregor Esser, Munich, DE;
Helmut Altheimer, Baisweil-Lauchdorf, DE;
Edda Wehner, Emmering, DE;
Stephan Trumm, Munich, DE;
Rainer Sessner, Roth, DE;
Dietmar Uttenweiler, Icking, DE;
Wolfgang Becken, Munich, DE;
Gregor Esser, Munich, DE;
Helmut Altheimer, Baisweil-Lauchdorf, DE;
Edda Wehner, Emmering, DE;
Stephan Trumm, Munich, DE;
Rainer Sessner, Roth, DE;
Dietmar Uttenweiler, Icking, DE;
Rodenstock GmbH, Munich, DE;
Abstract
Method for assessing an optical property of korder of an optical element at an evaluation point. The optical element has a boundary surface formed of a refractive base surface and a phase-modifying optical element. The method includes determining the properties of a wavefront in the local surrounding of the evaluation point by means of a local wavefront tracing, and determining the optical property at the evaluation point based on the properties of the wavefront in the local surrounding of the evaluation point, wherein the local wavefront tracing has a local wavefront tracing upon passage through the boundary surface, and the local wavefront tracing upon passage through the boundary surface is performed according to the equation for the local wavefront tracing through the refractive base surface, the equation being supplemented by an additive additional term PK.