The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Jul. 27, 2011
Koji Ikuta, Nagoya, JP;
Masashi Ikeuchi, Yokohama, JP;
Koji Ikuta, Nagoya, JP;
Masashi Ikeuchi, Yokohama, JP;
Japan Science and Technology Agency, Kawaguchi-shi, JP;
Abstract
Provided is a 3-dimensional confocal microscopy apparatus which is manufactured by combining a confocal microscope and an optical tweezers technique, wherein a pair of lenses for focal plane displacement where one lens is movable in the optical axis direction is arranged between a fixed objective lens and a fluorescent light imaging camera, and the 3-dimensional confocal microscopy apparatus also includes a mean which corrects the aberration of a fluorescent confocal image obtained by the fluorescent imaging camera. Accordingly, it is possible to provide a 3-dimensional confocal microscopy apparatus which can acquire a 3-dimensional image of a specimen during a manipulation of the specimen using optical tweezers without affecting an optical trap.