The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Dec. 20, 2010
Kenneth H. Wong, Santa Rosa, CA (US);
Robert E. Shoulders, Santa Rosa, CA (US);
Joel P. Dunsmore, Sebastopol, CA (US);
Thomas Reed, Santa Rosa, CA (US);
Erwin F. Siegel, Windsor, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Robert E. Shoulders, Santa Rosa, CA (US);
Joel P. Dunsmore, Sebastopol, CA (US);
Thomas Reed, Santa Rosa, CA (US);
Erwin F. Siegel, Windsor, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile