The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Oct. 06, 2015
Applicant:
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Assignee:
SHIMADZU CORPORATION, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01);
Abstract
The detection surface of each of a plurality of detection elements is arranged on an arc along a diffractometer circle (reference circle). This allows each detection element to detect X-rays diffracted by a specimen at the focal position. Because this prevents errors in the X-ray intensity detected by each detection element, more accurate diffraction information can be obtained. As a result, a more accurate analysis can be performed in less time by detecting X-rays diffracted by the specimen using a plurality of detection elements.