The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Dec. 01, 2016
Applicant:
Horiba, Ltd., Kyoto, JP;
Inventors:
Assignee:
Horiba, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/55 (2014.01); G01N 21/61 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 21/61 (2013.01); G01N 33/0036 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/06113 (2013.01);
Abstract
A gas analysis device includes a probe tube, a flange, an optical system member, and heaters. The probe tube includes an optical path through which measurement light is projected onto a prescribed measurement region of a sample gas flowing through a flue and/or is received from the measurement region. The flange is fixed to the outer periphery of the probe tube and is attached to a pipe side wall. The optical system member projects measurement light onto the sample gas S within the measurement region and/or receives measurement light from the measurement region. The heaters are disposed within the flange and heats the portion where the probe tube and flange are fixed to each other.