The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Feb. 18, 2016
Applicant:

Azbil Corporation, Chiyoda-ku, JP;

Inventors:

Masashi Furuya, Chiyoda-ku, JP;

Daisuke Obara, Chiyoda-ku, JP;

Assignee:

AZBIL CORPORATION, Chiyoda-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01); G01N 21/53 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1436 (2013.01); G01N 15/1459 (2013.01); G01N 21/53 (2013.01); G01N 2015/1006 (2013.01); G01N 2021/6469 (2013.01);
Abstract

A particle detector that includes an inspection light source that irradiates a flow cell with inspection light, the flow cell that allows a fluid containing a particle to flow therethrough, the flow cell including a semispherical reflective film that reflects reaction light generated by the particle irradiated with the inspection light, and a semispherical lens portion through which the reaction light reflected by the semispherical reflective film passes, an elliptical mirror that has a first focus at a position of the flow cell, and that reflects the reaction light having passed through the semispherical lens portion of the flow cell, and an optical detector that is disposed at a second focus of the elliptical mirror and that detects the reaction light reflected by the elliptical mirror.


Find Patent Forward Citations

Loading…