The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Mar. 27, 2015
Zhejiang Sci-tech University, Zhejiang, CN;
ZHEJIANG SCI-TECH UNIVERSITY, Zhejiang, CN;
Abstract
An absolute distance measurement apparatus and method using laser interferometric wavelength leverage includes a light source system, a wavelength-leverage laser interferometric system and an interference signal processing and controlling system. The light source system outputs a orthogonally linearly polarized beam with the wavelength λand the wavelength λ. The orthogonally linearly polarized beam projects onto the wavelength-leverage laser interferometric system to form the interference beam. The interference beam projects onto the interference signal processing and controlling system. In the wavelength-leverage laser interferometric system, the synthetic wavelength and the single wavelength as well as the measured absolute distance and the moving displacement of the cube-corner prism in the reference arm form a wavelength-leverage absolute distance measurement relationship.