The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

May. 20, 2015
Applicant:

Voco Gmbh, Cuxhaven, DE;

Inventor:

Alexander Knüttel, Viernheim, DE;

Assignee:

Voco GmbH, Cuxhaven, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02 (2006.01); A61C 13/08 (2006.01); G01J 3/50 (2006.01); G01B 11/24 (2006.01); A61C 9/00 (2006.01); G03H 1/04 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02029 (2013.01); A61C 9/0073 (2013.01); A61C 13/082 (2013.01); G01B 9/02007 (2013.01); G01B 9/02027 (2013.01); G01B 9/02047 (2013.01); G01B 11/2441 (2013.01); G01J 3/508 (2013.01); G03H 1/0443 (2013.01); G03H 1/0465 (2013.01); G03H 2001/0033 (2013.01); G03H 2210/13 (2013.01); G03H 2210/30 (2013.01); G03H 2222/13 (2013.01); G03H 2222/16 (2013.01); G03H 2222/34 (2013.01);
Abstract

Apparatus for detecting a 3D structure of an object, comprising at least three laser emitters and a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation. The illumination radiation strikes the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns formed from the interference of the reference and object radiation and an analysis unit analyzes the interference patterns. At least two of the laser emitters emit laser radiation in the invisible range and the analysis unit detects the object in three dimensions based on the interference patterns of the invisible laser radiation. At least one of the laser emitters emits colored laser radiation and the analysis unit deduces the object's color based on the intensity of the colored object radiation reflected by the object.


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