The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

May. 09, 2017
Applicant:

Tesa SA, Renens, CH;

Inventors:

Dikran Antreasyan, Meyrin, CH;

Christophe Jaquet, La Sarraz, CH;

Serge Mariller, Cheseaux-sur-Lausanne, CH;

Assignee:

TESA SA, Renens, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01); G01B 7/012 (2006.01);
U.S. Cl.
CPC ...
G01B 5/012 (2013.01); G01B 7/012 (2013.01);
Abstract

A touch probe for a coordinate measuring machine with a processor which is programmed to generate a trigger signal signalling a contact between a stylus of the probe and a workpiece, whenever one of a plurality displacement signals exceeds a corresponding threshold. In addition, or in alternative, a delayed trigger is generated based on a processing a plurality of samples of displacement signals that are stored in a buffer. The processor is programmed to minimize anisotropy of the probe response. Furthermore, the thresholds can be modified during operations based on commands received from the CMM controller.


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