The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Sep. 17, 2015
Applicant:

Dr. Johannes Heidenhain Gmbh, Traunreut, DE;

Inventor:

Peter Fischer, Rimsting, DE (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/10 (2006.01); G01D 5/244 (2006.01);
U.S. Cl.
CPC ...
G01B 3/1061 (2013.01); G01D 5/24485 (2013.01); G01B 3/10 (2013.01);
Abstract

A position-measuring device includes a first assembly and a second assembly. The first assembly, installable on a first object, has a profiled element that bears a scale having a first and second measuring graduation. The second assembly, installable on a second object, has a first scanning unit that is movable along a travel path in a measuring direction to scan the first measuring graduation. A position of the first object relative to the second object is therefore measurable. A second scanning unit is mounted on the profiled element so as to enable the second measuring graduation to be scanned, and is positioned in a way that allows the first scanning unit to traverse collision-free along the travel path at a distance spaced apart from the second scanning unit orthogonally to the measuring direction such that a displacement of the scale relative to the first object is measurable.


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