The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Oct. 04, 2016
Applicant:
Nalco Company, Naperville, IL (US);
Inventors:
Jin Wang, Houston, TX (US);
Nigel P. Hilton, Houston, TX (US);
Glenn L. Scattergood, Shanghai, CN;
Sam Ferguson, Sugar Land, TX (US);
Assignee:
Nalco Company LLC, Naperville, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C10G 7/10 (2006.01); C10G 75/02 (2006.01); G05B 23/02 (2006.01); G01N 17/02 (2006.01);
U.S. Cl.
CPC ...
C10G 75/02 (2013.01); G05B 23/0221 (2013.01); G01N 17/02 (2013.01);
Abstract
A method of correcting measurements of a chemical sensor used in an industrial facility. The method involves correcting for errors known to occur in the steady state and the dynamic state for specifically recognized situations. This method allows for correcting errors that occur due to deadtime, false zero measurements, and non-linear disturbances. The method combines automated measurement techniques and human know how to progressively learn and refine the accuracy of the corrections.