The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Mar. 26, 2014
Applicant:
Siemens Medical Solutions Usa, Inc., Malvern, PA (US);
Inventor:
Xuan-Ming Lu, Issaquah, WA (US);
Assignee:
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01); G01S 15/89 (2006.01); G01S 7/52 (2006.01); B06B 1/06 (2006.01);
U.S. Cl.
CPC ...
A61B 8/5207 (2013.01); A61B 8/445 (2013.01); A61B 8/4483 (2013.01); A61B 8/4488 (2013.01); A61B 8/4494 (2013.01); A61B 8/5215 (2013.01); B06B 1/0607 (2013.01); G01S 7/52079 (2013.01); G01S 15/8915 (2013.01);
Abstract
Volume scanning along different planes is provided using angling of the elements. Rather than orthogonal dicing of the slab, kerfs are formed at non-parallel and non-perpendicular angles to the azimuth axis of the array or longitudinal axis of the slab. Apertures formed from selected groups of the angled elements and/or parts of angled elements may be used to steer along planes that extend at an angle of 5 degrees or more away from the azimuth or longitudinal axis. By walking the aperture, different parallel planes are scanned with a one-dimensional array of elements.