The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Dec. 01, 2015
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Heiner Daerr, Hamburg, DE;

Roger Steadman Booker, Aachen, DE;

Gereon Vogtmeier, Aachen, DE;

Ewald Roessl, Henstedt-Ulzburg, DE;

Gerhard Martens, Henstedt-Ulzburg, DE;

Carolina Ribbing, Aachen, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/26 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/06 (2013.01); A61B 6/4042 (2013.01); A61B 6/4078 (2013.01); A61B 6/4241 (2013.01); A61B 6/485 (2013.01); A61B 6/582 (2013.01);
Abstract

The invention relates to a system () for generating spectral computed tomography projection data. A spectral projection data generation device () comprising an energy-resolving detector generates spectral computed tomography projection databased on polychromatic radiation (), which has been provided by a radiation device (), after having traversed an examination zone (), and a reference values generation device generates energy-dependent reference values based on radiation, which has not traversed the examination zone. A spectral parameter providing unit () provides a spectral parameter being indicative of a spectral property of the radiation device based on the energy-dependent reference values. In particular, spectral properties of the radiation device can be monitored over time, wherein this information can be used for, for instance, correcting the spectral computed tomography projection data, and/or, if undesired spectral properties of the radiation device are indicated, triggering a replacement of the radiation device.


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