The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Aug. 08, 2017
Adom, Advanced Optical Technologies Ltd, Lod, IL;
Yoel Arieli, Jerusalem, IL;
Yoel Cohen, Nes Ziona, IL;
Shlomi Epstein, Jerusalem, IL;
Dror Arbel, Tzur Itzhak, IL;
Ra'anan Gefen, Reut, IL;
Abstract
Apparatus and methods are described for performing structure measurement on a tear film of an eye of a subject. At least a portion of a surface of the tear film is illuminated using a broadband light source. A spectrum of light of the broadband light that is reflected from at least one point of the tear film is measured, using a spectrometer. Color information for a plurality of points of the tear film is obtained, by imaging a field of view of the tear film using a color camera. Using a processing unit, data from the color camera and data from the spectrometer that are indicative of characteristics of the tear film are received, and based upon a combination of the data received from the color camera and the data received from the spectrometer, an output is generated that is indicative of a structure of the tear film.