The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

May. 26, 2015
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventor:

Bart Moutton, Gits, BE;

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); G01B 7/06 (2006.01); A01F 12/44 (2006.01); G01B 7/04 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1271 (2013.01); A01D 41/1276 (2013.01); A01F 12/44 (2013.01); G01B 7/048 (2013.01); G01B 7/08 (2013.01); G01B 7/10 (2013.01);
Abstract

A sensor for measuring a thickness of a layer of a grain/residue mixture as the layer is transported through a cleaning arrangement of a combine harvester. The sensor is mounted on a support surface of a grain pan or a sieve of the cleaning arrangement and comprises a tower-shaped support structure with sensor elements attached to the structure and forming a vertical stack of sensor elements, so that a number of sensor elements is submerged in the layer and a number of sensor elements extends above the layer. The sensor elements are configured to measure an electrical property that changes as a function of immediate surroundings of the sensor elements. The sensor elements are configured to be read out independently from each other.


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