The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Oct. 29, 2013
Leica Geosystems Ag, Heerbrugg, CH;
Gregory Charles Walsh, Walnut Creek, CA (US);
Christopher Thewalt, Walnut Creek, CA (US);
LEICA GEOSYSTEMS, AG, Heerbrugg, CH;
Abstract
A model-based scan line encoder is disclosed. A method of model-based scan line encoding includes defining a geometry model for describing a scan line of a scan, the scan line including multiple scan points. The method further includes calculating a trajectory model representing an approximate pattern of deviation of the multiple scan points relative to the geometry model. The method further includes calculating multiple residuals, each of the residuals associated with a difference between the deviation of the scan points and the trajectory model. The method may further include compressing the residuals.