The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Jan. 24, 2017
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventor:
Bas Hulsken, Noord Brabant, NL;
Assignee:
Koninklijke Philips N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G02B 21/24 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G02B 21/002 (2013.01); G02B 21/241 (2013.01); G02B 21/244 (2013.01); G02B 21/245 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); H04N 5/247 (2013.01);
Abstract
The present invention relates to the field of digital pathology and in particular to whole slide scanners. A tilted autofocus image sensor images an oblique cross-section of the slide. For focusing multiple sequential overlapping images, which have been taken by the tilted sensor, are compared. The axial position of the tissue layer can be determined from the polar error signal resulting from this differential measurement.