The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Oct. 20, 2016
Applicants:

Yusuke Ishizaki, Kanagawa, JP;

Takehiro Chiba, Kanagawa, JP;

Inventors:

Yusuke Ishizaki, Kanagawa, JP;

Takehiro Chiba, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); H04N 1/00 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00082 (2013.01); H04N 1/00015 (2013.01); H04N 1/00037 (2013.01); H04N 1/00058 (2013.01); H04N 1/0061 (2013.01); H04N 2201/0094 (2013.01);
Abstract

A mark detecting device includes: a belt on which a plurality of marks are provided along a moving direction of the belt; a light-emitting element configured to irradiate at least one of the marks with light; a light-receiving element configured to receive a reflected light reflected from at least one of the belt and the mark of the light irradiated from the light-emitting element and output a signal; and a light amount adjuster configured to compare a first value obtained from the signal output by the light-receiving element and a second value obtained from a signal output by the light-receiving element after the first value is obtained, and to perform light amount adjustment of the light-emitting element when a difference between the first value and the second value is a first threshold or more.


Find Patent Forward Citations

Loading…