The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Aug. 07, 2017
Applicant:

Hioki Denki Kabushiki Kaisha, Nagano, JP;

Inventors:

Masao Higuchi, Nagano, JP;

Fumio Tokutake, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H02S 50/10 (2014.01); G01N 21/88 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); G01N 21/88 (2013.01); G01R 31/26 (2013.01); G01R 31/28 (2013.01);
Abstract

A solar cell testing apparatus is provided that tests bypass diodes in a solar cell string constructed by connecting a plurality of solar cell modules, which include solar cells and the bypass diodes, in series for failures in the open position. The solar cell testing apparatus includes a unidirectional element that is connected between a positive electrode and a negative electrode of the solar cell string, and a voltage applier that applies a test voltage across the positive electrode and the negative electrode of the solar cell string to which the unidirectional element is connected. The solar cell testing apparatus also includes a current detector that detects a current flowing in the solar cell string, and a processor that executes processes that measure a current value of a shorted current of a solar cell string and tests for failures.


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